Is technology companies and Cascade Microtech company recently to celebrate 25 years of cooperation, help customers to cope with the challenge of the toughest semiconductor research and development of history. This cooperation has brought significant design and test on the wafer of innovation, help customers to accelerate the product on the market.

Is DE science and technology from 1939 by Bill Hewlett and Dave Packard founded the original HP. Cascade Microtech corporation by Eric Strid and Reed Gleason was founded in 1983. In 1990, the two companies began to create product roadmap, implements the major technological breakthrough. With more than 100 years of experience in semiconductor testing, two companies' joint innovation also affects the customer to research and design on the wafer.

Cascade Microtech, President and chief executive Michael Burger said, "we are with decades of cooperation of science and technology, we have unique advantages in solving customer problems. Through the cooperation in the early stages of the development cycle, we can provide customers with truly innovative testing solutions, improve measurement accuracy and deliver reliable results."

Keysight - Cascade Microtech customer solutions has the following features:

Y: 1991 HP / 4155 Keysight semiconductor parameter analyzer helps clients in low noise and leakage current measurement. Customer feedback shows that the need to expand these measurements to probe and wafer substrate. Prompting Cascade Microtech corporation developed MicroChamber and protective chuck ® technology, in order to probe and chuck terminals under 10 fA on current measurements. Customers for the first time to see the transistor leakage current.

Y, 1999:1999 xf network analyzer system supports the first 110 GHz broadband coaxial solutions, providing customers with the best overall performance, fully meet the design and testing of challenge in the millimeter wave applications. The introduction of coaxial broadband solutions, can use a broadband solutions in a single scan device measuring task, and in the past the same task you need to use three sets of instruments and probe, also need to be calibrated. New solution not only saves customers time and money, but also provide more comprehensive and more accurate measurement, measurement range extends to the probe.

Y 2015: complete wafer level measurement solution for fast and accurate measurement on semiconductor wafer, by guaranteed the system configuration, installation and support, can save the time of measurement, reduce the risk of the customer. Customers guaranteed - don't miss any components. Proven beforehand, this system can provide reliable probe performance, ensure faster to obtain first-hand data.

Is DE science and technology, vice President and general manager Mr Gregg Peters said, "over the past 25 years, customers can succeed in measuring device characterization and wafer, team cooperation is indispensable. The effect of our two companies, today we are going to celebrate the success of the past, look forward to continue cooperation in the next 25 years, to help our clients will product to market faster."